منابع مشابه
Genetic Defect Based March Test Generation for SRAM
The continuos shrinking of semiconductor’s nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the e↵ect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by han...
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The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory blocks testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March Ctest has the followi...
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A new approach to automatically generating diagnostic memory tests of linear order (O(N)) is presented. The resulting March tests provide complete detection and distinguishing of all single-cell and two-cell fault models. The approach is based on state transition graph modelling, decomposition of functional memory faults into basic fault effects, and output tracing. For each of the targeted bas...
متن کاملDeveloping the Persian version of the homophone meaning generation test
Background: Finding the right word is a necessity in communication, and its evaluation has always been a challenging clinical issue, suggesting the need for valid and reliable measurements. The Homophone Meaning Generation Test (HMGT) can measure the ability to switch between verbal concepts, which is required in word retrieval. The purpose of this study was to adapt and validate the Persian ve...
متن کاملLow Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)
Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computers
سال: 2008
ISSN: 0018-9340
DOI: 10.1109/tc.2008.105